State of the Art Facility
Our multi-user core facility has advanced high resolution transmission electron microscopes (TEM), scanning electron microscopes (SEM) and a Focused Ion Beam (FIB)/SEM microscope. Surface science instrumentation category has time-of-flight secondary ion mass spectrometry (TOF-SIMS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), ultravioet photoelectron spectroscopy (UPS), and low energy inverse photoelectron spectroscopy (LEIPS) capabilities with Ar+ and C60 sources. We frequently use Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectroscopy (WDS), sample manipulation and surface modification capabilities on our electron microscopes. Our goal is to provide best microscopy and surface analysis technical services to our faculty and industry collaborators.
Video Transcript
0:00-0:01
Researcher walking towards the lab at electron microscopy facility
0:01-0:03
Retrieving sample holder for Hitachi SU9000EA from zone cleaner
0:03-0:05
Loading sample holder into Hitachi SU9000EA
0:05-0:07
Finishing loading into Hitachi SU9000EA
0:07-0:08
Using manual operations panel on Hitachi SU9000EA
0:08-0:09
Observing SEM image on Hitachi SU9000EA
0:10-0:12
Features of Hitachi SU9000EA
0:12-0:13
Operation of Hitachi SU9000EA
0:14-0:23
Four men installing Hitachi SU9000EA
0:23-0:41
Scanning various areas of Hitachi SU9000EA
0:41-0:45
Web address for Clemson University Electron Microscope Facility
